Haoze Li, Jinyuan Tang, Zhongyi Luo, Quanhe Yan, Run Xu, Weiwei Meng, Fei Xu, Feng Hong. "Electronically inert Te ensures superior stability of Nb2SiTe4: An
                    <i>ab initio</i>
                    defect study." Journal of Applied Physics (2026). https://doi.org/10.1063/5.0313559