W. Hamouda, Y. Yamashita, S. Ueda, S. Matzen, O. Renault, F. Mehmood, T. Mikolajick, U. Schroeder, N. Barrett. "Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy." Applied Physics Letters, 2025. doi:10.1063/5.0288835