Rejmer, A., Ozcan-Atar, A., Kołkowski, W., Pasternak, I., Kozdra, S., Materna, A., Pelucchi, E., Strupiński, W., Michałowski, P. P. (2025). Defect-specific compensation and redistribution of Si in GaAs:Si structures resolved at subnanometer scale. Journal of Applied Physics. https://doi.org/10.1063/5.0281923