Irvine, S. J., Katagiri, K., Ræder, T. M., Boesenberg, U., Chalise, D., Stanton, J. I., Pal, D., Hallmann, J., Ansaldi, G., Brausse, F., Eggert, J. H., Fang, L., Folsom, E., Haubro, M., Holstad, T. S., Madsen, A., Möller, J., Nielsen, M. M., Poulsen, H. F., Pudell, J., Rodriguez-Fernandez, A., Schoofs, F., Seiboth, F., Wang, Y., Jo, W., Youssef, M., Zozulya, A., Haldrup, K., Dresselhaus-Marais, L. E. (2025). Dark-field x-ray microscopy for 2D and 3D imaging of microstructural dynamics at the European x-ray free-electron laser. Journal of Applied Physics. https://doi.org/10.1063/5.0239034