Yubin Choi, Hyojin Yang, Hwan Jin Kim, Sejun Park, Yoon Jung Lee, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim, Haesung Kim, Jong-Ho Bae. "Characterization of trap dynamics via transient response in amorphous InGaZnO thin-film transistors." Applied Physics Letters, 2026. doi:10.1063/5.0332203