Li, Y., Yang, Z., Peng, X., Fu, Y., Lin, J., Yue, L., Zhang, F., Yang, W. (2026). 2.7-kV CuCrO2/Ga2O3 heterojunction diode with stepped-mesa termination and on-state electrical stress reliability. Applied Physics Letters. https://doi.org/10.1063/5.0346157